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4H Semi-Insulating SiC Substrate With Si Face Cmp Polished, Research Grade,4”Size

Categories SiC Wafer
Brand Name: PAM-XIAMEN
Place of Origin: China
MOQ: 1-10,000pcs
Price: By Case
Payment Terms: T/T
Supply Ability: 10,000 wafers/month
Delivery Time: 5-50 working days
name: sic Wafer
Description: Research Grade 4H SEMI Substrate
Grade: Research Grade
Size: 4 inch
keywords: single crystal SiC wafer
application: electronic industry
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4H Semi-Insulating SiC Substrate With Si Face Cmp Polished, Research Grade,4”Size

4H Semi-Insulating SiC Substrate With Si Face Cmp Polished, Research Grade,4”Size


PAM-XIAMEN provides high quality single crystal SiC (Silicon Carbide)waferfor electronic and optoelectronic industry. SiC wafer is a next generation semiconductor materialwith unique electrical properties and excellent thermal properties for high temperature and high power device application. SiC wafer can be supplied in diameter 2~6 inch, both 4H and 6H SiC , N-type , Nitrogen doped , and semi-insulating type available.


Please contact us for more information:

SILICON CARBIDE MATERIAL PROPERTIES


PolytypeSingle Crystal 4HSingle Crystal 6H
Lattice Parametersa=3.076 Åa=3.073 Å
c=10.053 Åc=15.117 Å
Stacking SequenceABCBABCACB
Band-gap3.26 eV3.03 eV
Density3.21 · 103 kg/m33.21 · 103 kg/m3
Therm. Expansion Coefficient4-5×10-6/K4-5×10-6/K
Refraction Indexno = 2.719no = 2.707
ne = 2.777ne = 2.755
Dielectric Constant9.69.66
Thermal Conductivity490 W/mK490 W/mK
Break-Down Electrical Field2-4 · 108 V/m2-4 · 108 V/m
Saturation Drift Velocity2.0 · 105 m/s2.0 · 105 m/s
Electron Mobility800 cm2/V·S400 cm2/V·S
hole Mobility115 cm2/V·S90 cm2/V·S
Mohs Hardness~9~9

4H Semi-Insulating SIC Substrate, Research Grade,4”Size

SUBSTRATE PROPERTYS4H-51-SI-PWAM-250 S4H-51-SI-PWAM-330 S4H-51-SI-PWAM-430
DescriptionResearch Grade 4H SEMI Substrate
Polytype4H
Diameter(50.8 ± 0.38) mm
Thickness(250 ± 25) μm (330 ± 25) μm (430 ± 25) μm
Resistivity (RT)>1E5 Ω·cm
Surface Roughness< 0.5 nm (Si-face CMP Epi-ready); <1 nm (C- face Optical polish)
FWHM<50 arcsec
Micropipe DensityA+≤1cm-2 A≤10cm-2 B≤30cm-2 C≤50cm-2 D≤100cm-2
Surface Orientation
On axis <0001>± 0.5°
Off axis 3.5° toward <11-20>± 0.5°
Primary flat orientationParallel {1-100} ± 5°
Primary flat length16.00 ± 1.70 mm
Secondary flat orientation Si-face:90° cw. from orientation flat ± 5°
C-face:90° ccw. from orientation flat ± 5°
Secondary flat length8.00 ± 1.70 mm
Surface FinishSingle or double face polished
PackagingSingle wafer box or multi wafer box
Usable area≥ 90 %
Edge exclusion1 mm

sic crystal defects

Most of the defects which were observed in SiC were also observed in other crystalline materials. Like the dislocations, stacking faults (SFs), low angle boundaries (LABs) and twins. Some others appear in materials having the Zing- Blend or the Wurtzite structure, like the IDBs. Micropipes and inclusions from other phases mainly appear in SiC.


Choice of Polytype for Devices

As discussed in Section 4, 4H- and 6H-SiC are the far superior forms of semiconductor device quality SiC commercially available in mass-produced wafer form. Therefore, only 4H- and 6H-SiC device processing methods will be explicitly considered in the rest of this section. It should be noted, however, that most of the processing methods discussed in this section are applicable to other polytypes of SiC, except for the case of a 3C-SiC layer still residing on a silicon substrate, where all processing temperatures need to be kept well below the melting temperature of silicon (~1400°C). It is generally accepted that 4H-SiC’s substantially higher carrier mobility and shallower dopant ionization energies compared to 6H-SiC (Table 5.1) should make it the polytype of choice for most SiC electronic devices, provided that all other device processing,performance, and cost-related issues play out as being roughly equal between the two polytypes. Furthermore, the inherent mobility anisotropy that degrades conduction parallel to the crystallographic c-axis in 6H-SiC particularly favors 4H-SiC for vertical power device configurations (Section the 5.6.4). Because the ionization energy of the p-type acceptor dopants is significantly deeper than for the n-type donors, a much higher conductivity can be obtained for the n-type SiC substrates than for the p-type substrates.

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