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| Categories | USB DVI HDMI Connectors |
|---|---|
| Description: | USB 3.1 16P SMD USB, DVI, HDMI Connector Adapters RoHS |
| Protocol Standard: | USB 3.1 |
| Voltage Rating: | 5V |
| Brand Name: | TPS08-N1F1-2016-A |
| length: | 6.5mm |
| Number of Contacts: | 16P |
| Model Number: | TPS08-N1F1-2016-A |
| Stock: | 150000 |
| Gender: | Female |
| Connect-Disconnect Life: | 5,000 cycles |
| Packaging Details: | SMD |
| Connector Type: | Type-C |
| Center Height: | 3.16mm |
| Delivery Time: | 3-5工作日 |
| MOQ: | 1500 |
| Detection color: | Black |
| Company Info. |
| Shenzhen ECER Network Technology Co., Ltd. |
| Verified Supplier |
| View Contact Details |
| Product List |
This specification covers the requirements for product performance and test methods of USB C TYPE Series Connectors. Product shall be of the design, construction and physical dimensions specified in the applicable product drawing.
73t R LXH
DB-SP-006 Rev.: A5
2018/01/05
| Item | Test Description | Test Methods | Requirement |
|---|---|---|---|
| 4.1.1 Examination of product (Outward Appearance Structure) | Shall be confirmed with eyes in accordance with each drawing. Shall be confirmed by using proper measuring instruments. | EIA 364-18 | 1).Outward appearance shall be good without such injurious problem 2).Structure shall be meet the design and dimensional requirements of drawing. |
| Item | Test Description | Test Methods | Requirement |
|---|---|---|---|
| 4.2.1 Low Level Contact Resistance | EIA 364-23 (or MIL-STD-1344A, Method 3002.1, Test Condition B) | 40 m Maximum 30m (Max) when measured at 20mv(max) open circuit at 100mA.Contact resistance below 40 m after 10000 insertion/extraction cycles at a maximum rate of 500 cycles per hour | |
| 4.2.2 Insulation Resistance | EIA 364-21 (or MIL-STD-202F, Method 302, Test Condition B) | 100 M Minimum | |
| 4.2.3 Dielectric Withstanding Voltage | Test between adjacent contacts of mated and unmated connector assemblies. The object of this test procedure is to detail a test method to prove that a MICRO USB connector can operate safely at its rated voltage and withstand momentary over potentials due to switching, surges and/or other similar phenomena. | EIA 364-20 (or MIL-STD-202F, Method 301, Test Condition B) | 100 V.R.M.S is applied between adjacent contacts and insulation resistance is measured within 1 minute. There shall be no shortcircuiting and damage detected at AC for 1 minute. |
| Item | Test Description | Test Methods | Requirement |
|---|---|---|---|
| 4.3.1 Insertion Force | The insertion force test shall be done | EIA 364-13 | 0.5~2.0kgf at a maximum rate of 12.5mm/min. |
| 4.3.2 Extraction Force | The extraction force test shall be done | EIA 364-13 | 0.8~2.0kgf at a maximum rate of 12.5mm/min. |
| 4.3.3 Durability | Mate and unmate Connector assemblies for 10000 cycles at maximum rated of 500 cycles per hour. Flip Interval: Every 2500 cycles | EIA 364-09 | 1)No flashover or insulation breakdown 2) Extraction Force: 1-1000cycles: 0.8~2.0kgf 1000~10000cycles: 0.6~2.0kgf 3)Contact Resistance: Max.50m |
| 4.3.4 Mechanical Shock | Subject mated connector to 50Gs half-sine shock pulses of 11msec duration. Three shocks in each direction applied along three mutually perpendicular planes for a total of 18 | EIA-364-27B | No discontinuities of 1 microsecond or long duration. See note |
| 4.3.5 Vibration | Subject mated connectors to 10~55~10Hz traversed in 1 minute at 1.52mm amplitude 2 hours each of 3 mutually perpendicular planes. | EIA-364-28 | No discontinuities of 1 microsecond or long duration. See note |
| Item | Test Description | Test Methods | Requirement |
|---|---|---|---|
| 4.4.1 Thermal Shock | Subject mated connectors to ten cycles between 30C to +80C. The object of this test is to determine the resistance of a micro usb connector to exposure at extremes of high and low temperatures and to the shock of alternate exposures to these extremes, simulating the worst case conditions for storage, transportation and application. | EIA 364-32, Test Condition I, (or MIL-202F, Method 107G Condition A.) | 1).Shall meet visual requirement, show no physical damage. 2).Shall meet requirements of additional tests as specified in test sequence in Section 5 |
| 4.4.2 Humidity | Subject mated connectors to 168 Hours (seven complete cycles) The object of this test procedure is to detail a standard method for the evaluation of the properties of materials used in Micro USB connectors as these influenced by the effects of high humidity and heat. | EIA 364-31, Test Condition A Method I, (or MIL-202F, Method 103B Test Condition B.) | 1).Shall meet visual requirement, show no physical damage. 2).Shall meet requirements of additional tests as specified in test sequence in Section 5 |
| 4.4.3 Salt Spray | Subject mated connectors to 24 hours at 35 C with 5%-Salt-solution concentration. | MIL-STD-202F, Method 101D, Test Condition B | 1).Shall meet visual requirement, show no physical damage. 2).Shall meet requirements of additional tests as specified in test sequence in Section 5 |
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