SHETIME NOS11-S1F1-2000-A

Categories	Memory Connectors
Description:	Push-Push 1.37mm SMD PC Card Sockets RoHS
Height Above Board:	1.37mm
Brand Name:	NOS11-S1F1-2000-A
MOQ:	1500
Packaging Details:	SMD
Card Connection Mode:	Push-Push
Model Number:	NOS11-S1F1-2000-A
Stock:	150000
Delivery Time:	3-5工作日

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Shenzhen ECER Network Technology Co., Ltd.

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SHETIME NOS11-S1F1-2000-A

Product Overview

This specification covers the NANO SIM card socket connector. It is designed for use with SIM cards and provides reliable connectivity.

Key Features:

NANO SIM card support
Available with or without a post
High-quality materials for durability
Specific electrical and mechanical characteristics for reliable performance

Applications:

This connector is suitable for various electronic devices requiring NANO SIM card connectivity, including mobile devices, IoT modules, and other communication equipment.

Brand GAOYUEDA ELECTRONICS CO.,LTD

Origin CHINA

Customer P/N FP-090012

Part Number(s) NOS11-S1F1-2000-A | NOS21-S1F1-2000-A

Description NANO SIM Card Socket (with post | without post)

Color Black (implied by housing material)

Certifications UL 94V-0 (for Housing Material)

Part No.	Description	Material - Housing	Material - Contact	Material - Shell	Finish - Contact	Rating Current (Max.)	Contact Resistance (Max.)	Dielectric Withstanding Voltage (Min.)	Insulation Resistance (Min.)	Mating Cycles	Operating Temperature
NOS11-S1F1-2000-A / NOS21-S1F1-2000-A	NANO SIM Card Socket	LCP S475 UL 94V-0	C5191	SUS304-H	Gold Flash Plated on Contact Area; Gold Flash Plated on Solder Tails	0.5A	50 m	500V AC	1000 M	3000 Cycles	-20C to +65C

Test Item	Requirement	Procedure
Contact Resistance	50 m Max (Initial) / 100 m Max (Final)	EIA-364-23A
Dielectric Withstanding Voltage	500 VAC for 1 minute (0.5 mA MAX current leakage)	EIA-364-20A
Insulation Resistance	100 M Min. (250 VDC impressed voltage)	EIA-364-21A
Vibration	No physical damage; Current discontinuity 10 s; Contact Resistance 100m	EIA-364-28A
Mechanical Shock	No damage, loose part nor crack; Discontinuity: 10s MAX; Contact Resistance 100m	EIA-364-28A (Modified for Shock)
Durability	No physical damage; Contact Resistance 100m	EIA-RS-364-09A (3000 Cycles)
Contact Normal Force	40gf /pin Min. (Initial); 25~35gf /pin Min. (After durability)	Tensile force test equipment
Contact Retention Force	50gf /pin Min.	Tensile strength tester
Humidity Test (Steady state)	No physical damage; Contact resistance 100 m; Insulation Resistance 1000 M	EIA-RS-364-31A (402, 90~95% RH for 96 hours)
Thermal Shock	No physical damage; Contact resistance 100 m; Insulation Resistance 1000 M	EIA-364-32C (5 cycles: -55 to +85)
Temperature Life	No physical damage; Contact resistance 100 m; Insulation Resistance 1000 M	85+2 for 96 hours
Solderability	No physical damage; Coverage 95% Min.	EIA-RS-364-52 (245 5 for 10 0.5 seconds)
Salt Spray	No detrimental corrosion; Contact resistance 100 m	EIA-RS-364-26A (5% Salt water, 352 for 16 hours)
Resistance to Soldering Heat	No physical damage	Reflow soldering conditions (Fig 1)

SHETIME NOS11-S1F1-2000-A

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