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| Categories | Cryogenic Probe Station |
|---|---|
| Brand Name: | Truth Instruments |
| Model Number: | PS1DP-Cryo |
| Place of Origin: | CHINA |
| Price: | Price Negotiable | Contact us for a detailed quote |
| Payment Terms: | T/T |
| Vacuum: | Low-temperature Vacuum <1.2E-3Pa |
| Sample Temperature: | <10 K-420 K |
| Vibration: | Sample Stage Vibration <1 μm (peak-to-peak) |
| Needing Range: | Any Point Within 25 Mm Diameter |
| Number of Probe Arms: | Standard 4 Probe Arms, Up To 8 Supported |
| Probe Arm Stroke: | X-Y-Z, 50 Mm-25 Mm-25 Mm |
| Temperature Stability: | <±20 MK (10 K-420 K) |
| Magnetic Field: | Superconducting Magnet, Vertical Direction, ±3 T Strength |
| Company Info. |
| Truth Instruments Co., Ltd. |
| Verified Supplier |
| View Contact Details |
| Product List |
Cryogenic Vertical Superconducting Magnetic Field Probe Station
The PS1DP-Cryo closed-loop cryogenic superconducting magnet probe station, based on a 4 K closed-loop cryogenic probe station, adds a ±3 T superconducting magnet, providing a low-temperature strong magnetic field environment for 2-inch samples. It can accommodate samples for electrical transport testing of 2D materials, spintronic devices, superconducting materials, and Hall effect testing of semiconductor materials or devices. The probe station provides comprehensive control and testing software for automated and systematic testing solutions. Users can monitor and control the temperature and magnetic field of the probe station in real-time via software, and perform testing sequences for magnetoresistance, second harmonic, Hall effect, SOT, etc., making it an efficient solution for electrical transport characterization under low-temperature strong magnetic fields.
| Equipment Performance Indicator | Description |
|---|---|
| Sample Temperature | <10 K-420 K |
| Temperature Stability | <±20 mK (10 K-420 K) |
| Magnetic Field | Superconducting magnet, vertical direction, ±3 T strength |
| Vibration | Sample stage vibration <1 μm (peak-to-peak) |
| Vacuum | Low-temperature vacuum <1.2E-3Pa |
| Probe Arm Stroke | X-Y-Z, 50 mm-25 mm-25 mm |
| Needing Range | Any point within 25 mm diameter |
| Number of Probe Arms | Standard 4 probe arms, up to 8 supported |
| Thermal Anchor | Probe arms and sample stage temperature difference <10 K |
| Sample Space | Sample holder diameter up to 51 mm |
| Sample Holder Type | Ground, coaxial, triaxial options |
| DC Probe | ZN50, tip material tungsten or beryllium copper |
| Frequency Range | 0-50 MHz with low-temperature coaxial cable, 0-1 GHz with semi-rigid coaxial cable |
| Microwave Probe | GSG, tip material tungsten |
| Frequency Range | 0-40 GHz with K-type connector, 0-67 GHz with 1.85 mm connector |
| Electrical Leakage Current | <100 fA@1 V |
| Optical Microscope | 0.75 X-3.75 X continuous zoom |
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