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Multi Functional AFM Atomic Force Microscopy Precise Biology Microscope

Categories Atomic Force Microscope
Brand Name: Truth Instruments
Model Number: AtomEdge Pro
Place of Origin: CHINA
MOQ: 1
Price: Price Negotiable | Contact us for a detailed quote
Payment Terms: T/T
Name: AFM Atomic Force Microscopy
Scanning Method: XYZ three-axis full sample scanning
Scanning Range: 100 μm x100 μmx 10 μm
Scanning Rate: 0.1-30 Hz
Noise Level in The XY Direction: 0.4 nm
Noise Level in The Z Direction: 0.04 nm
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Multi Functional AFM Atomic Force Microscopy Precise Biology Microscope

Multi-Functional Atomic Force Microscope

Product Model:

AtomEdge Pro

Product Description:

The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy, electrostatic force microscopy, scanning Kelvin microscopy, and piezoelectric force microscopy, featuring strong stability and good scalability. In addition, functional modules can be flexibly customized according to user needs, providing targeted solutions for specific research fields and achieving an efficient detection platform with multiple uses in one machine.

Equipment Performance:
Sample Size25 mm
Scanning MethodXYZ three-axis full sample scanning
Scanning Range100 μm x100 μmx 10 μm
Scanning Rate0.1-30 Hz
Noise Level in The XY Direction0.4 nm
Noise Level in The Z Direction0.04 nm
Nonlinearity0.15% in the xY direction and 1% in the Z direction
lmage Sampling PointThe maximum resolution of the scanning probe image is 4096x4096
Working ModeContact mode, tap mode, phase imaging mode, lift mode, multi-directional scanning mode
Multifunctional
Measurement
Electrostatic force microscope (EFM), scanning Kelvin microscope (KPFM), piezoelectric force micro-scope (PFM),magnetic force microscope (MFM), force curve
Application Cases:
Grid Calibration Standard
  • Grid Calibration Standard
  • Scanning Mode: Topography Measurement
  • Scanning Range: 25 μm * 25 μm
Titanium Film - Aluminum Titanate Film
  • Titanium Film - Aluminum Titanate Film
  • Scanning Mode: Piezoresponse Force Microscopy (PFM)
  • Scanning Range: 10 μm * 10 μm
Vanadium Sulfide Thin Film
  • Vanadium Sulfide Thin Film
  • Scanning Mode: Electrostatic Force Microscopy (EFM)
  • Scanning Range: 5 μm * 5 μm
Vanadium Sulfide Thin Film
  • Vanadium Sulfide Thin Film
  • Scanning Mode: Kelvin Probe Force Microscopy (KPFM)
  • Scanning Range: 5 μm * 5 μm
Co/Fe/B Thin Film
  • Co/Fe/B Thin Film
  • Scanning Mode: Magnetic Force Microscopy (MFM)
  • Scanning Range: 25 μm * 25 μm
Co/Pt Thin Film
  • Co/Pt Thin Film
  • Scanning Mode: Magnetic Force Microscopy (MFM)
  • Scanning Range: 30 μm * 30 μm
Morphology of Au-Ti Striped Electrode Sheet
  • Morphology of Au-Ti Striped Electrode Sheet
  • Scanning Mode: Tapping Mode
  • Scanning Range: 18 μm * 18 μm
Al₂O₃ Whisker Morphology
  • Al₂O₃ Whisker Morphology
  • Scanning Mode: Tapping Mode
  • Scanning Range: 15 μm * 15 μm
Epoxy Resin Polymer Morphology
  • Epoxy Resin Polymer Morphology
  • Scanning Mode: Tapping Mode
  • Scanning Range: 7 μm * 7 μm
Pt-Co Thin Film Magnetism
  • Pt-Co Thin Film Magnetism
  • Scanning Mode: MFM (Lift Mode)
  • Scanning Range: 5 μm * 5 μm
Lithium Niobate Thin Film
  • Lithium Niobate Thin Film
  • Scanning Mode: Piezoresponse Force Microscopy (PFM)
  • Scanning Range: 35 μm * 35 μm
Bacillus Immobilis
  • Bacillus Immobilis
  • Scanning Mode: Topography Measurement
  • Scanning Range: 3 μm * 3 μm
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