IEC 62368-1 R6mm Stainless Steel Blunt Test Probe Of Figure V.3
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IEC 62368-1 R6mm Stainless Steel Blunt Test Probe Of Figure V.3 Product information: The blunt probe of figure V.3 conforms to IEC 62368-1:2018 clause 5.3.2, 5.4.10, V.1.4 and figure V.3, IEC60950 figure 2C, IEC60065 figure B1, IEC62151 figure 3 and UL6500 figure B.1. It is used for the bare parts of TNV circuits of information technology equipment to see whether they have sufficient protection. Technical Parameters: Probe Length 80 mm Probe......
Sinuo Testing Equipment Co. , Limited
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IEC 62368 Test Probe Kits
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Product Description Consists of Five test probe: 1) Straight Unjointed Test Probes 2) Figure V.2 - Jointed Test Probe 3) Figure V.3 - Blunt Probe 4) Figure V.4 - Wedge probe 5) Diameter 1 mm, Length 20 mm Terminal Probe 1) Straight Unjointed Test Probes......
HK LEE HING INDUSTRY CO., LIMITED
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Stainless Steel IEC 62368 Figure V.5 Terminal Probe
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...Probes IEC62368 probe no. Probe Name IEC 62368 Figure V.1 Jointed test probe for equipment likely to be accessible to children IEC62368 Figure V.2 Jointed test probe for equipment like to be accessible to children IEC62368 Figure V.3 Blunt probe, Telecom Test Probe IEC62368 Figure V.4 Wedge probe IEC62368 Figure V.5 Terminal probe I) IEC 62368 Figure V.1 Jointed test probe......
Guangzhou Shice Equipment Co., Ltd.
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80mm Blunt Probe As Per IEC 60950 IEC 60065 IEC 62368-1 For Testing TNT Circuit
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Blunt Probe as Per IEC60950, IEC60065 and IEC62368-1 for Testing TNT Circuit 1. Introduction The blunt probe is designed according to IEC60950 figure 2C, IEC60065 figure B1, IEC62151 figure 3, UL6500 figure B.1, IEC62368-1 figure V.3. It is applied to ......
Pego Electronics (Yi Chun) Company Limited
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IEC 62368-1 Figure V4 Test Finger Probe Wedge Probe For Testing Document Shredders
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... to the opening: − with a force up to 45 N for a strip-cut type device; and − with a force up to 90 N for a cross-cut type device. Test Finger Probe NOTE Media destruction devices are typically identified as either...
Guangzhou HongCe Equipment Co., Ltd.
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IEC 60950 Figure 2C / IEC62368-1 Figure V.3 Blunt Probe Testing the Limited Access to Telecommunications Voltages
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IEC 60950 Figure 2C / IEC62368-1 Figure V.3 Blunt Probe Testing the Limited Access to Telecommunications Voltages The Blunt probe is required in IEC62368,IEC 60950,IEC 60065, UL and CSA Standards. It is used to check the limited access to Telecommunications voltages (TNV), mainly telephone jacks and operator areas. Satisfies basic standard for telecom product safety. Meets Requirements for Testing Standard(s) including but not limited to:IEC...
KingPo Technology Development Limited
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IEC 60529 Jointed Test Finger Probe Stainless Steel With 50N Force
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...Probe Access Probes of IEC 60529 Jointed Test Finger With 50N Force Standard: IEC 60529 Degrees of protection provided by enclosures (IP Code) Figure 1 – Jointed test finger. IEC 61032 Protection of persons and equipment by enclosures –Probes for verification Figure 2–Test probe B. And other standard such as IEC 60335-1, IEC60884-1, IEC 60598-1, IEC60065-1, IEC 62368......
HJ AUTOMATIC CONTROL TECHNOLOGY CO., LTD
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