multiangle wafer defect inspection system

Brand Name:YUSH

Model Number:YS-8500

Place of Origin:Guangdong

...Inspection System ,YS-8500 adopts COMET's open X-ray tube design,and its defect inspection capability can reach 0.5um.It can realize 2D/3D/CT and other inspection methods,and is suitable for quality inspection,3D measurement and non-destructive analysis. Application Advantages With planar CT function(PCT),it can be applied to 3D/CT inspection of printed circuit boards,SMT,IGBT,wafers...

Model Number:NCJ-1600

Place of Origin:China

... with reflected and transmitted light, which are used for a variety of specialty applications such as semiconductor silicon wafer manufacturing, inspection and quality control like inspection of grain size, surface inclusions and defects, crystallography,

Brand Name:YUSH

Model Number:YS-8500

Place of Origin:GuangDong

...Inspection System ,YS-8500 adopts COMET's open X-ray tube design,and its defect inspection capability can reach 0.5um.It can realize 2D/3D/CT and other inspection methods,and is suitable for quality inspection,3D measurement and non-destructive analysis. Application Advantages With planar CT function(PCT),it can be applied to 3D/CT inspection of printed circuit boards,SMT,IGBT,wafers...

Brand Name:UNICOMP

Model Number:AX8200

Place of Origin:China

EMS Semiconductor Unicomp PCB X Ray Machine for Electronics BGA AX8200​ X-ray inspection system has been widely applied to Circuit Board Inspection,Semi-Conductor Inspection and Other Applications. (Offline X - Ray series) widely used in offline detection...

Brand Name:Jietai

Model Number:JTM-10720AD

Place of Origin:Dongguan, Guangdong

...Silicon Wafers Full-process Traceability, Cleanliness Meeting IATF 16949 Standard Closed-loop Online Inspection to Prevent Defective Products from Leaving the Line Machine Vision Sampling Inspection: One piece is automatically selected for inspection out ...