sem scanning electron atomic force microscope

Brand Name:CNOEC, OPTO-EDU

Model Number:A62.4501

Place of Origin:China

...Scanning Electron Atomic Force Microscope OPTO-EDU A62.4501 Product Description 1. Scan head and sample stage are designed together, strong anti-vibration performance 2. Precision laser detection and probe alignment device make laser adjustment simple and easy; 3. Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning...

Brand Name:KYKY

Model Number:EM6910

Place of Origin:China

...SEM manufacture experience, the whole EM series supports old system refurbished and customized system as SEM+, such as Electron Beam Lithography remodel, LaB6 upgrade,integrated with STM,AFM,Heating Stage;Cryo Stage;Tensile Stage;Micro-nano manipulator etc. System also has multiple interface at chamber for attaching most of the analysis detector in the market The EM69 series scanning electron microscope...

Brand Name:ZMSH

Model Number:SI WAFER

Place of Origin:CHINA

... wafer DSP SiO2 wafers Silicon oxide wafer 1inch 2inch 10x10mm Scanning electron microscope silicon wafer small square piece SEM Polished Silicon Wafer High-purity (11N) 1-12 inch single- and double-polished Czochralski wafers Sizes 1" 2" 3" 4" 5" 6" 8" ...

Brand Name:Hoan

Model Number:JMZ-TK1-7A

Place of Origin:China

... the upper limit of new discoveries. Equipment such as scanning electron microscopes (SEM), atomic force microscopes (AFM), lithography machines, and gravitational wave detection devices are sensitive to environmental vibrations at the nanometer or

Brand Name:iqualitrol

Model Number:VP-430

... excellent flatness with less stress deformation. VP-430 is an ideal preparation equipment for EBSD (backscattered electron diffraction), AFM (atomic force microscope) & SEM (scanning electron microscopy) analysis and Nano indentation or micro-hardness

Brand Name:iqualitrol

Model Number:VP-430

..., eliminate the surface stress and bring excellent flatness with less stress deformation. VP-430 is an ideal preparation equipment for EBSD (backscattered electron diffraction), AFM (atomic force microscope) & SEM (scanning

Brand Name:TISCO

Place of Origin:CHINA

Model Number:DN20、DN25、DN32、DN40、DN50

... instance: the scanning electron micro sconezz(SEM).the transmission electron microscope(TEM)the material testing machine. the large-type metallurgical microscope,the endurance testing machine,the IAS-4 image analyzer, the American ARL ...

Brand Name:Evergrowrs

Model Number:316 304 303 304H, 17-4ph ,17-7ph ,15-5ph

Place of Origin:China

...equipment, for instance: the scanning electron micro sconezz(SEM).the transmission electron microscope(TEM)the material testing machine. the large-type metallurgical microscope,the endurance testing machine,the IAS-4 image analyzer, the American...