Sign In | Join Free | My futurenowinc.com
futurenowinc.com
Products
Search by Category
Home > Other Metals & Metal Products >

P Type , InAs (Indium Arsenide) Wafer , 4”, Prime Grade

Categories InAs Wafer
Brand Name: PAM-XIAMEN
Place of Origin: China
MOQ: 1-10,000pcs
Payment Terms: T/T
Supply Ability: 10,000 wafers/month
Delivery Time: 5-50 working days
Packaging Details: Packaged in a class 100 clean room environment, in single container, under a nitrogen atmosphere
product name: Prime Grade InAs Wafer
Wafer Diamter: 4 inch
Conduction Type: P Type
Grade: Prime Grade
Wafer Thickness: 900±25um
keyword: Indium Arsenide InAs Wafer
  • Haven't found right suppliers
  • Our buyer assistants can help you find the most suitable, 100% reliable suppliers from China.
  • And this service is free of charge.
  • we have buyer assistants who speak English, French, Spanish......and we are ready to help you anytime!
Submit Buying Request
  • Product Details
  • Company Profile

P Type , InAs (Indium Arsenide) Wafer , 4”, Prime Grade

P Type , InAs (Indium Arsenide) Wafer , 4”, Prime Grade

PAM-XIAMEN offers InAs wafer – Indium Arsenide which are grown by LEC(Liquid Encapsulated Czochralski) or VGF(Vertical Gradient Freeze) as epi-ready or mechanical grade with n type, p type or undoped in different orientation(111),(100) or (110). PAM-XIAMEN can provide epi ready grade InAs wafer for your MOCVD & MBE epitaxial application .Please contact our engineer team for more wafer information.

4" InAs Wafer Specification

ItemSpecifications
DopantZinc
Conduction TypeP-type
Wafer Diameter4"
Wafer Orientation(100)±0.5°
Wafer Thickness900±25um
Primary Flat Length16±2mm
Secondary Flat Length8±1mm
Carrier Concentration(1-10)x1017cm-3
Mobility100-400cm2/V.s
EPD<3x104cm-2
TTV<15um
BOW<15um
WARP<20um
Laser markingupon request
Suface finishP/E, P/P
Epi readyyes
PackageSingle wafer container or cassette


What is the InAs Process?
InAs wafers must be prepared prior to device fabrication. To start, they must be completely cleaned to remove any damage that might have occurred during the slicing process. The wafers are then Chemically Mechanically Polished/Plaranrized (CMP) for the final material removal stage. This allows for the attainment of super-flat mirror-like surfaces with a remaining roughness on an atomic scale. After that is completed, the wafer is ready for fabrication.

Thermal properties of InAs Wafer

Bulk modulus5.8·1011 dyn cm-2
Melting point942 °C
Specific heat0.25 J g-1 °C-1
Thermal conductivity0.27 W cm-1 °C-1
Thermal diffusivity0.19 cm2s-1
Thermal expansion, linear4.52·10-6 °C-1

Temperature dependence of thermal conductivity.
n-type sample, no (cm-3): 1. 1.6·1016; 2. 2.0·1017;
p-type sample, po (cm-3): 3. 2.0·1017.

Temperature dependences of thermal conductivity for high temperatures
Electron concentration
no (cm-3): 1. 5·1016; 2. 2·1016; 3. 3·1016.
Temperature dependence of specific heat at constant pressure

For 298K < T < 1215K

Cp= 0.240 + 3.97·10-5·T (J g-1°C -1).


Temperature dependence of linear expansion coefficient
(low temperature)
Temperature dependence of linear expansion coefficient
(high temperature)
Temperature dependences of Nernst coefficient (transverse Nernst-Ettinghausen effect)
Electron concentration at 77K
no (cm-3): 1. 2.96·1016; 2. 4.46·1016; 3. 8.43·1016; 4. 4.53·1017; 5. 1.56·1018; 6. 2.28·1018; 7. 5·1018; 8. 1.68·1019.

Melting point Tm = 1215 K.
Saturated vapor pressure (in Pascals):

for 950 K - 2·10-3,
for 1000 K - 10-2,
for 1050 K - 10-1.

Thermal properties of InAs Wafer

Bulk modulus5.8·1011 dyn cm-2
Melting point942 °C
Specific heat0.25 J g-1 °C-1
Thermal conductivity0.27 W cm-1 °C-1
Thermal diffusivity0.19 cm2s-1
Thermal expansion, linear4.52·10-6 °C-1

Temperature dependence of thermal conductivity.
n-type sample, no (cm-3): 1. 1.6·1016; 2. 2.0·1017;
p-type sample, po (cm-3): 3. 2.0·1017.

Temperature dependences of thermal conductivity for high temperatures
Electron concentration
no (cm-3): 1. 5·1016; 2. 2·1016; 3. 3·1016.
Temperature dependence of specific heat at constant pressure

For 298K < T < 1215K

Cp= 0.240 + 3.97·10-5·T (J g-1°C -1).


Temperature dependence of linear expansion coefficient
(low temperature)
Temperature dependence of linear expansion coefficient
(high temperature)
Temperature dependences of Nernst coefficient (transverse Nernst-Ettinghausen effect)
Electron concentration at 77K
no (cm-3): 1. 2.96·1016; 2. 4.46·1016; 3. 8.43·1016; 4. 4.53·1017; 5. 1.56·1018; 6. 2.28·1018; 7. 5·1018; 8. 1.68·1019.

Melting point Tm = 1215 K.
Saturated vapor pressure (in Pascals):

for 950 K - 2·10-3,
for 1000 K - 10-2,
for 1050 K - 10-1.


Are You Looking for an InAs substrate?
PAM-XIAMEN is proud to offer indium phosphide substrate for all different kinds of projects. If you are looking for InAs wafers, send us enquiry today to learn more about how we can work with you to get you the InAs wafers you need for your next project. Our group team is looking forward to providing both quality products and excellent service for you!









































Product Tags:

n type wafer

  

3 inch wafer

  
Quality P Type , InAs (Indium Arsenide) Wafer , 4”, Prime Grade for sale
Send your message to this supplier
 
*From:
*To: XIAMEN POWERWAY ADVANCED MATERIAL CO., LTD.
*Subject:
*Message:
Characters Remaining: (0/3000)
 
Inquiry Cart 0