0.15 Nm High Resolution Microscopes Customized Atomic Microscopes

Product Description:

The Atomic Force Microscope is a cutting-edge tool designed for high-resolution imaging and nanoscale analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM offers atomic resolution imaging capabilities that are essential for a wide range of research applications.

Equipped with multiple imaging modes including Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, and Phase Imaging, this AFM provides versatile options for capturing detailed surface topography and properties of various samples.

One of the key features of this Atomic Force Microscope is its ability to accommodate sample sizes of up to 200 mm, allowing for the analysis of a wide range of materials and structures. Whether you are studying biological samples, nanomaterials, or thin films, this AFM offers the flexibility to handle diverse sample types with ease.

With a scanning angle range of 0-360°, users can precisely control the orientation and positioning of the probe to capture detailed images from different perspectives. This functionality is particularly useful for examining samples with complex geometries or structures that require imaging from multiple angles.

The Atomic Force Microscope supports various probe types including Silicon, Diamond, Gold, Platinum, and Carbon Nanotube probes, giving users the flexibility to choose the most suitable probe for their specific experimental requirements. Whether you need high sensitivity for soft samples or enhanced durability for demanding applications, this AFM offers a range of probe options to meet your needs.

In summary, the Atomic Force Microscope is a powerful tool for nanoscale analysis, offering atomic resolution imaging capabilities and a versatile range of imaging modes. With its advanced features and customizable probe options, this AFM provides researchers with the tools they need to explore and characterize a wide range of materials and structures with precision and accuracy.

Features:

• Product Name: Atomic Force Microscope
• Imaging Modes:
  • Contact
  • Tapping
  • Non-Contact
  • Lateral Force
  • Force Modulation
  • Phase Imaging
• Probe Type:
  • Silicon
  • Diamond
  • Gold
  • Platinum
  • Carbon Nanotube
• Resolution: 0.15 Nm (Nanometer Resolution)
• Sample Size: Up To 200 Mm
• Scanning Angle: 0-360°

Technical Parameters:

Applications:

Truth Instruments AtomMax Atomic Force Microscope, originating from China, is a versatile tool designed for high-resolution imaging and precise measurements in various scientific and industrial applications.

With imaging modes including Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, and Phase Imaging, the AtomMax offers multi-mode measurement capabilities suitable for a wide range of sample types and surface conditions. Whether analyzing biological samples, polymers, thin films, or nanomaterials, this AFM adapts to different imaging needs with atomic resolution precision.

The AtomMax accommodates sample sizes up to 200 mm, providing flexibility for studying macroscopic samples while still offering the high resolution required for detailed analysis. Its scanning range of 100 μm x 100 μm x 10 μm allows for comprehensive imaging of samples with varying topographies and dimensions.

Equipped with probe options such as Silicon, Diamond, Gold, Platinum, and Carbon Nanotube, the AtomMax enables users to tailor their imaging approach based on sample properties and desired resolution levels. The 0.15 nm resolution ensures that even the smallest features on a sample can be accurately captured and analyzed.

Product Application Occasions and Scenarios:

• Material Science: Study the surface morphology and mechanical properties of materials at the nanoscale.
• Biotechnology: Investigate biological samples with high precision for research and development purposes.
• Nanotechnology: Characterize nanomaterials and nanostructures for various applications.
• Pharmaceuticals: Analyze drug-delivery systems and pharmaceutical formulations with atomic resolution.
• Surface Chemistry: Explore surface interactions and chemical properties of materials.